DocumentCode :
1487031
Title :
500 GHz–750 GHz Rectangular-Waveguide Vector-Network-Analyzer Calibrations
Author :
Williams, Dylan F.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Volume :
1
Issue :
2
fYear :
2011
Firstpage :
364
Lastpage :
377
Abstract :
We develop an uncertainty analysis that captures the dominant sources of measurement error in state-of-the-art WM-380 (WR 1.5) rectangular-waveguide vector-network-analyzer measurements over the frequency range 500-750 GHz. We use the analysis to assess thru-reflect-line, thru-short-match, and thru-short-radiating-open calibrations. The comparison shows that thru-short-match and thru-short-radiating-open calibrations outperform thru-reflect-line calibrations, and that this is true even when multiple lines and optimal averaging are used to improve the thru-reflect-line calibrations.
Keywords :
calibration; measurement errors; network analysers; rectangular waveguides; frequency 500 GHz to 750 GHz; measurement error; rectangular-waveguide vector-network-analyzer calibrations; thru-reflect-line; thru-short-match; thru-short-radiating-open calibrations; uncertainty analysis; Calibration; Displacement measurement; Error analysis; Measurement errors; Measurement uncertainty; Rectangular waveguides; Uncertainty; Calibration; submillimeter wave; uncertainty analysis; vector network analyzer;
fLanguage :
English
Journal_Title :
Terahertz Science and Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
2156-342X
Type :
jour
DOI :
10.1109/TTHZ.2011.2127370
Filename :
5741780
Link To Document :
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