• DocumentCode
    1487069
  • Title

    A study on thin-film-media noise by magnetic domain observation

  • Author

    Aoi, H. ; Tsuchiya, R. ; Shiroishi, Y. ; Matsuyama, H.

  • Author_Institution
    Hitachi Ltd., Tokyo, Japan
  • Volume
    24
  • Issue
    6
  • fYear
    1988
  • fDate
    11/1/1988 12:00:00 AM
  • Firstpage
    2715
  • Lastpage
    2717
  • Abstract
    Magnetic domain structures of signal-recorded and reverse-DC-erased thin-metal-film media with different signal-recorded noise characteristics have been observed by a spin-polarized scanning electron microscope to determine the noise-generating mechanism. In noisy media, magnetic domains around 10-μm wide grow at 38 KFCI, and recorded transitions are observed inside them. At the maximum reverse-DC-erase noise condition, which corresponds to the DC demagnetized condition, magnetic domains from 2- to 5-μm wide are observed. In low-noise media, no large, distinct domains are seen for either condition. The squareness (Mr/Ms) of noisy media is 10% higher and the switching field distribution (Δh/Hr) is 40% lower than those of low-noise media. The results indicate that large signal-recorded noise is generated from large irregular magnetic domains that grow through strong exchange coupling between crystallites
  • Keywords
    magnetic domains; magnetic thin films; metallic thin films; noise; scanning electron microscope examination of materials; SEM; domain structures; exchange coupling; low-noise media; magnetic domain observation; noise characteristics; noise-generating mechanism; recorded transitions; reverse-DC-erased media; scanning electron microscope; signal recorded media; signal-recorded noise; spin-polarized; switching field distribution; thin-film-media noise; Disk recording; Gaussian noise; Magnetic domains; Magnetic field measurement; Magnetic heads; Magnetic noise; Magnetic recording; Neodymium; Noise measurement; Scanning electron microscopy;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.92222
  • Filename
    92222