Title :
High-Performance Conformal FDTD Techniques
Author :
Yu, Wenhua ; Mittra, Raj ; Yang, Xiaoling ; Liu, Yongjun ; Rao, Qinjiang ; Muto, Akira
Author_Institution :
EMC Lab., Pennsylvania State Univ., University Park, PA, USA
fDate :
6/1/2010 12:00:00 AM
Abstract :
A host of electromagnetic simulation tools are available today for modeling electromagnetic systems such as microwave circuits, antenna and associated feeds, electronic devices prone to electromagnetic compatibility (EMC) or electromagnetic interference (EMI) problems, and digital and RF packages. A number of different numerical techniques are used in computational electromagnetics (CEM) solvers, each of which has its own strong suit, as well as limitations. The solvers include the finite element method (FEM) [1], method of moments (MoM) [2], [3], transmission-line modeling (TLM) method [4]–[6], finite integration technique (FIT) [7], and finite difference time domain (FDTD) [8], [9] method. Among these, the finite difference method offers an important advantage over some of the other techniques because it is not only flexible as well as general-purpose in its scope of applications, but it is highly parallelizable as well. In this work, we describe a general-purpose electromagnetic simulation technique [10], which is based on the parallel conformal FDTD method, and we illustrate its engineering applications to the simulation of microwave devices and components.
Keywords :
computational electromagnetics; finite difference time-domain analysis; parallel algorithms; electromagnetic simulation; engineering application; high-performance conformal FDTD techniques; microwave components; microwave devices; parallel conformal FDTD code; parallel conformal FDTD method; parallel efficiency; parallel platform; Circuit simulation; Computational modeling; Electromagnetic compatibility; Electromagnetic devices; Electromagnetic modeling; Finite difference methods; Microwave antennas; Microwave circuits; Microwave devices; Time domain analysis;
Journal_Title :
Microwave Magazine, IEEE
DOI :
10.1109/MMM.2010.936496