DocumentCode :
1487530
Title :
Influence of wall contacts on measured complex permittivity spectra at coaxial line frequencies
Author :
Mattar, Karim E. ; Watters, David G. ; Brodwin, Morris E.
Author_Institution :
Dept. of Phys., Calgary Univ., Alta., Canada
Volume :
39
Issue :
3
fYear :
1991
fDate :
3/1/1991 12:00:00 AM
Firstpage :
532
Lastpage :
537
Abstract :
The effects on observed complex permittivity caused by gaps between a sample and the conductors of the coaxial sample holder are examined. A transverse resonance model relates the observed and true values given the dimensions of the gap. This model confirms the accuracy of the simpler capacitance model for small conductivities and low frequencies. The authors describe how, experimentally, variation in the observed sample characteristics with frequency may be used to identify a gap problem. Experimental results demonstrate the usefulness of conducting pastes or copper plating in reducing the gap effect
Keywords :
microwave measurement; modelling; permittivity measurement; capacitance model; coaxial line frequencies; coaxial sample holder; complex permittivity spectra; gap problem; transverse resonance model; wall contacts; Capacitance; Coaxial components; Conducting materials; Conductivity measurement; Conductors; Copper; Frequency measurement; Permittivity measurement; Resonance; Solid state circuits;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.75297
Filename :
75297
Link To Document :
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