DocumentCode

1487557

Title

General Upper Bound On Single-event Upset Rate

Author

Pollock, Justin

Volume

37

Issue

2

fYear

1990

fDate

4/1/1990 12:00:00 AM

Firstpage

1065

Lastpage

1071

Keywords

Aerospace electronics; Degradation; Earth; Energy exchange; Equations; Error analysis; Ionizing radiation; Semiconductivity; Semiconductor materials; Upper bound;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.1990.574199

Filename

574199