DocumentCode :
1487557
Title :
General Upper Bound On Single-event Upset Rate
Author :
Pollock, Justin
Volume :
37
Issue :
2
fYear :
1990
fDate :
4/1/1990 12:00:00 AM
Firstpage :
1065
Lastpage :
1071
Keywords :
Aerospace electronics; Degradation; Earth; Energy exchange; Equations; Error analysis; Ionizing radiation; Semiconductivity; Semiconductor materials; Upper bound;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1990.574199
Filename :
574199
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1487557
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