Title :
A built-in supply current test circuit for pin opens in assembled PCBs
Author :
Umezu, Shoichi ; Hashizume, Masaki ; Yotsuyanagi, Hiroyuki
Author_Institution :
Univ. of Tokushima, Tokushima, Japan
Abstract :
In this paper, a built-in test circuit of electrical tests is proposed to detect pin opens of CMOS ICs. When a circuit is tested by the test method, current is made to flow through a targeted pin. An open defect is detected by means of the difference between the current of a defect-free circuit and the measured one. Feasibility of tests with the built-in supply current test circuit is examined by Spice simulation. It is shown that a pin open in a CMOS IC can be detected with the test circuit at a speed of 1MHz.
Keywords :
CMOS integrated circuits; built-in self test; integrated circuit testing; printed circuit testing; CMOS ICs; Spice simulation; assembled PCBs; built-in supply current test circuit; defect-free circuit; electrical tests; frequency 1 MHz; open defect detection; pin detection; Integrated circuit interconnections; Integrated circuit modeling; Inverters; Logic gates; Pins; Soldering; assembled PCB test; biulit-in test circuit; electrical test; pin open; supply current testing;
Conference_Titel :
Electronics Packaging (ICEP), 2014 International Conference on
Conference_Location :
Toyama
Print_ISBN :
978-4-904090-10-7
DOI :
10.1109/ICEP.2014.6826694
