Title :
Characterization of the Pearson family of distributions
Author :
Nair, N. Unnikrishnan ; Sankaran, P.G.
Author_Institution :
Cochin Univ. of Sci. & Technol., India
fDate :
4/1/1991 12:00:00 AM
Abstract :
The Pearson family of distributions is characterized in terms of the failure rates. Analogous results when failure time is discrete are presented. Theorems are proved which generalize some previously published results concerning the gamma and negative binomial distributions
Keywords :
failure analysis; reliability theory; statistical analysis; Pearson distributions; failure rates; failure time; gamma distributions; negative binomial distributions; reliability theory; Probability; Reliability theory; Sufficient conditions;
Journal_Title :
Reliability, IEEE Transactions on
