Title :
Guest editors´ introduction: the new world of large embedded memories
Author :
Rajsuman, R. ; Catthoor, F.
Author_Institution :
Colorado State University
Abstract :
Presents the guest editorial for this issue of the publication.
Keywords :
Computer Society; Design engineering; Design methodology; Design optimization; Electrical engineering; Materials testing; Multimedia systems; Research and development; Senior members; System testing;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2001.922797
