DocumentCode :
1488567
Title :
Reliability Analysis of k -out-of- n Systems With Single Cold Standby Using Pearson Distributions
Author :
Van Gemund, Arjan J C ; Reijns, Gerard L.
Author_Institution :
Fac. of Electr. Eng., Math., & Comput. Sci., Delft Univ. of Technol., Delft, Netherlands
Volume :
61
Issue :
2
fYear :
2012
fDate :
6/1/2012 12:00:00 AM
Firstpage :
526
Lastpage :
532
Abstract :
k-out-of-n systems with cold standby units are typically studied for unit lifetime distributions that allow analytical tractability. Often, however, these distributions differ significantly from reality. In this paper, we present an analytical approach to compute the mean failure time for k -out-of-n systems with a single cold standby unit for the wide class of lifetime distributions that can be captured by the Pearson distribution. The method requires the first four statistical moments of the unit´s lifetime distribution to be given, and computes the mean failure time using the Pearson distribution as an intermediate vehicle during the numerical integration. Experimental results for various instances of the Weibull distribution show that the numerical accuracy of the approach is high, with less than 0.5 percent error across a large range of k -out-of-n systems.
Keywords :
Weibull distribution; redundancy; Pearson distributions; Weibull distribution; analytical tractability; cold standby units; k-out-of-n systems; mean failure time computation; numerical accuracy; numerical integration; reliability analysis; statistical analysis; unit lifetime distributions; Accuracy; Calculus; Computational modeling; Correlation; Reliability; Shape; Weibull distribution; Cold standby; Pearson approximation; failure time analysis; order statistics; redundant systems;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.2012.2192587
Filename :
6179573
Link To Document :
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