• DocumentCode
    1488972
  • Title

    An analog synchronous mirror delay for high-speed DRAM application

  • Author

    Shim, Daeyun ; Lee, Dong-Yun ; Jung, Sanghun ; Kim, Chang-Hyun ; Kim, Wonchan

  • Author_Institution
    Sch. of Electr. Eng., Seoul Nat. Univ., South Korea
  • Volume
    34
  • Issue
    4
  • fYear
    1999
  • fDate
    4/1/1999 12:00:00 AM
  • Firstpage
    484
  • Lastpage
    493
  • Abstract
    An analog synchronous mirror delay (ASMD) is proposed, which provides fast locking characteristics in recovery from power-down mode in a DRAM application. As an open-loop fast locking system, ASMD measures and compensates the skew between external and internal clocks in analog operation mode within two cycles of an input clock using a charge-pumping scheme. This ASMD has no static phase error problem, which is related to the path selection operation of previously implemented SMD schemes. To enhance the linearity of delay characteristics and to increase the maximum operating frequency, dual pumping and multiple folding schemes are also proposed. An experimental chip with basic ASMD configuration is fabricated using 0.6-μm double-metal CMOS technology to verify the feasibility of the proposed scheme. With functional blocks of the charge pump, comparator, and control pulse generator, it occupies an area of 1.1×0.7 mm2 . An experimental ASMD has a working range of 100-300 MHz at 3.3 V with peak-to-peak jitter of 140 ps±200 mV of sinusoidal supply noise of 1 MHz added, and power dissipation of 30 mW at 250-MHz clock input
  • Keywords
    CMOS memory circuits; DRAM chips; comparators (circuits); delay lock loops; high-speed integrated circuits; synchronisation; timing jitter; 0.6 micron; 100 to 300 MHz; 140 ps; 250 MHz; 3.3 V; 30 mW; analog synchronous mirror delay; charge pump; charge-pumping scheme; comparator; control pulse generator; delay characteristics; double-metal CMOS technology; dual pumping; high-speed DRAM application; locking characteristics; maximum operating frequency; multiple folding schemes; open-loop fast locking system; peak-to-peak jitter; power dissipation; power-down mode; sinusoidal supply noise; skew; CMOS technology; Charge pumps; Clocks; Current measurement; Delay lines; Frequency; Linearity; Mirrors; Pulse generation; Random access memory;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.753681
  • Filename
    753681