Title :
Silicon-on-Insulator Echelle Grating WDM Demultiplexers With Two Stigmatic Points
Author :
Horst, Folkert ; Green, William M J ; Offrein, Bert Jan ; Vlasov, Yurii A.
Author_Institution :
Zurich Res. Lab., IBM Res. GmbH, Ruschlikon, Switzerland
Abstract :
We present ultracompact integrated optical echelle grating wavelength-division-multiplexing (de)multiplexers for on-chip optical networks, fabricated using high-index-contrast silicon-on-insulator photonic waveguide technology. These devices are based on a design with two stigmatic points, which enables compact geometries with reduced aberrations. In the example presented here, this design allows us to achieve an eight-channel (de)multiplexer with 3.2-nm channel spacing, within an ultracompact footprint of 250 times 200 mum. The channel-to-channel isolation of the devices is 19 dB. The minimum insertion loss, relative to a straight waveguide, is 3 dB with a channel-to-channel variation of 0.5 dB.
Keywords :
aberrations; channel spacing; demultiplexing equipment; diffraction gratings; integrated optics; optical communication equipment; optical waveguides; silicon-on-insulator; wavelength division multiplexing; Si; WDM; aberrations; channel-to-channel isolation; echelle grating; eight-channel demultiplexer; insertion loss; on-chip optical networks; photonic waveguide; silicon-on-insulator; stigmatic points; wavelength division multiplexing demultiplexers; Demultiplexing; gratings; optical planar waveguide components; optics; silicon-on-insulator (SOI) technology; wavelength-division multiplexing (WDM);
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2009.2032151