• DocumentCode
    1489106
  • Title

    Effects of optical absorption on the quasi-Fermi level splitting at the emitter-base junction in npn heterojunction bipolar phototransistors

  • Author

    Roenker, Kenneth P. ; Frimel, Steven M. ; Cahay, Marc M.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Cincinnati Univ., OH, USA
  • Volume
    46
  • Issue
    4
  • fYear
    1999
  • fDate
    4/1/1999 12:00:00 AM
  • Firstpage
    669
  • Lastpage
    674
  • Abstract
    This paper analyzes the effects of optical absorption in the quasi-neutral base region of npn heterojunction bipolar phototransistors (HPT´s) on the extent of electron quasi-Fermi level splitting at the emitter-base heterojunction interface. The principle of current balance is used to match the thermionic-field-emission from the emitter with the base electron diffusion current, taking into account the nonuniform optical generation in the base. The increase in minority carrier concentration produced by optical generation in the base leads to a decrease in the quasi-Fermi level splitting at the heterojunction interface which reduces the net electron injection into the base, the emitter injection efficiency and current gain to an extent that depends on the incident optical power and the base-emitter bias
  • Keywords
    Fermi level; bipolar transistors; carrier density; field emission; light absorption; minority carriers; phototransistors; semiconductor device models; thermionic emission; base electron diffusion current; base-emitter bias; current balance; current gain; electron injection; emitter injection efficiency; emitter-base junction; heterojunction bipolar phototransistors; incident optical power; minority carrier concentration; n-p-n HPT; nonuniform optical generation; optical absorption; quasi-Fermi level splitting; quasi-neutral base region; thermionic-field-emission; Absorption; Bipolar transistors; Electron emission; Electron optics; Heterojunctions; Phototransistors; Physics; Power generation; Stimulated emission; Thermionic emission;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.753699
  • Filename
    753699