• DocumentCode
    1489244
  • Title

    An Effective Framework to Evaluate Dynamic Partial Reconfiguration in FPGA Systems

  • Author

    Papadimitriou, Kyprianos ; Anyfantis, Antonis ; Dollas, Apostolos

  • Author_Institution
    Dept. of Electron. & Comput. Eng., Tech. Univ. of Crete, Chania, Greece
  • Volume
    59
  • Issue
    6
  • fYear
    2010
  • fDate
    6/1/2010 12:00:00 AM
  • Firstpage
    1642
  • Lastpage
    1651
  • Abstract
    The most popular representative devices of reconfigurable computing are field-programmable gate arrays (FPGAs). A promising feature of an FPGA is the ability to reuse the same hardware for different tasks at different phases of an application execution. Moreover, the tasks can be swapped on the fly while part of the hardware continues to operate. This is known as dynamic reconfiguration, and evaluation of its performance presents interesting research challenges. This paper introduces a general framework for measuring the reconfiguration time from the system perspective. In addition, a methodology for setting up different system parameters and automatically gathering and processing the experimental results has been developed. It is proven that these parameters affect the applications designed in a dynamically reconfigurable system, and rapid evaluation enables quick examination of their impact on performance. Results demonstrate the usefulness of the framework.
  • Keywords
    field programmable gate arrays; reconfigurable architectures; FPGA systems; dynamic partial reconfiguration; field-programmable gate arrays; reconfigurable computing; Application software; Circuits; Field programmable gate arrays; Hardware; Programmable logic arrays; Protocols; Random access memory; Reconfigurable architectures; System analysis and design; Time measurement; Dynamic reconfiguration; field-programmable gate arrays (FPGAs); measurement; partial reconfiguration; reconfigurable architectures; system analysis and design;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2009.2026607
  • Filename
    5463267