Bloch line propagation by field-access scheme with Co-Pt bit patterns

Author

Maruyama, Y. ; Ikeda, T. ; Fujimoto, K. ; Suzuki, R.

Author_Institution

Hitachi Ltd., Tokyo, Japan

Volume

24

Issue

6

fYear

1988

fDate

11/1/1988 12:00:00 AM

Firstpage

3027

Lastpage

3029

Abstract

Bloch line (BL) pair propagations has been investigated by a field-access scheme, applying triangular pulses to a rocking conductor. The stripe domain was stabilized by a current. Current bit confinement initially revealed a bit potential of 0.4 to 1.8 Oe for 2.5-μm-period tracks. Then noncurrent bit confinement patterns were produced in Co-Pt films with high coercivity (1.5 kOe) and high residual flux density (5 kG). A film thickness of 350 Å produced a bit potential of 1.5 Oe when the spacing between the Co-Pt film and the garnet surface was 1 μm. Bit-by-bit propagation of a BL pair was achieved with a 5 to 6% bias field margin in a drive field greater than 3.3 Oe

Keywords

cobalt alloys; magnetic bubble memories; magnetic domain walls; platinum alloys; Bloch line propagation; CoPt bit patterns; bit by bit propagation; bit potential; current bit confinement; field-access scheme; garnet surface; high coercivity; high residual flux density; noncurrent bit confinement patterns; rocking conductor; stripe domain; triangular pulses; Argon; Coercive force; Conductive films; Conductors; Garnet films; Magnetic confinement; Magnetic films; Magnetic flux; Radio frequency; Testing;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.92323

Filename

92323