• DocumentCode
    1489536
  • Title

    A Backside-Illuminated Image Sensor With 200 000 Pixels Operating at 250 000 Frames per Second

  • Author

    Le, Cuong Vo ; Etoh, T.Goji ; Nguyen, H.D. ; Dao, V.T.S. ; Soya, H. ; Lesser, Michael ; Ouellette, David ; van Kuijk, H. ; Bosiers, J. ; Ingram, G.

  • Author_Institution
    Kinki Univ., Higashi-Osaka, Japan
  • Volume
    56
  • Issue
    11
  • fYear
    2009
  • Firstpage
    2556
  • Lastpage
    2562
  • Abstract
    In this paper, a high-speed image sensor with very high sensitivity is developed. The high sensitivity is achieved by introduction of backside illumination and charge-carrier multiplication (CCM). The high frame rate is guaranteed by installing the in situ storage image sensor (ISIS) structure on the front side. A test sensor of the BSI-ISIS has been developed and evaluated. It is shown that an image with a very low signal level embedded under the noise floor is recognizable by activating the CCM.
  • Keywords
    CCD image sensors; backside illumination; backside-illuminated image sensor; charge-carrier multiplication; high-speed image sensor; storage image sensor; Buffer storage; Charge coupled devices; Electrons; Image sensors; Image storage; Intersymbol interference; Lighting; Noise level; Pixel; Testing; in situ storage image sensor (ISIS); Charge-carrier multiplication (CCM); high sensitivity; high speed;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2009.2030601
  • Filename
    5272464