• DocumentCode
    1489582
  • Title

    Special Issue on Solid-State Image Sensors

  • Author

    Fossum, Eric R. ; Hynecek, J. ; Tower, J. ; Teranishi, N. ; Nakamura, Jun ; Magnan, Pierre ; Theuwissen, A.

  • Author_Institution
    Semicond. R&D Center, Samsung Electron. Co., Ltd., Yongin, South Korea
  • Volume
    56
  • Issue
    11
  • fYear
    2009
  • Firstpage
    2376
  • Lastpage
    2379
  • Abstract
    This editorial summarizes the contents of this special issue of the IEEE Transactions on Electron Devices on solid state image sensors. Several researches on CCD and CMOS image sensors are included in this issue.
  • Keywords
    CCD image sensors; CMOS image sensors; CCD image sensors; CMOS image sensors; solid-state image sensors;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2009.2031900
  • Filename
    5272474
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1489582