• DocumentCode
    1489660
  • Title

    Multibit Error-Correction Methods for Latency-Constrained Flash Memory Systems

  • Author

    Ankolekar, Priyanka P. ; Isaac, Roger ; Bredow, Jonathan W.

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Texas at Arlington, Arlington, TX, USA
  • Volume
    10
  • Issue
    1
  • fYear
    2010
  • fDate
    3/1/2010 12:00:00 AM
  • Firstpage
    33
  • Lastpage
    39
  • Abstract
    This paper presents multibit error-correction schemes for nor Flash used specifically for execute-in-place applications. As architectures advance to accommodate more bits/cell and geometries decrease to structures that are smaller than 32 nm, single-bit error-correction codes (ECCs) are unable to compensate for the increasing array bit error rates, making it imperative to use 2-b ECC. However, 2-b ECC algorithms are complex and add a timing overhead on the memory read access time. This paper proposes low-latency multibit ECC schemes. Starting with the binary Bose-Chaudhuri-Hocquenghem (BCH) codes, an optimized scheme is introduced which combines a multibit error-correcting BCH code with Hamming codes in a hierarchical manner to give an average latency as low as that of the single-bit correcting Hamming decoder. A Hamming algorithm with 2-b error-correcting capacity for very small block sizes (< 1 B) is another low-latency multibit ECC algorithm that is discussed. The viability of these methods and algorithms with respect to latency and die area is proved vis-a??-vis software and hardware implementations.
  • Keywords
    BCH codes; Hamming codes; error correction codes; error statistics; flash memories; 2-b ECC; Hamming codes; NOR flash; binary Bose-Chaudhuri-Hocquenghem codes; execute-in-place applications; latency-constrained flash memory systems; memory read access time; multibit error-correction methods; single-bit correcting Hamming decoder; single-bit error-correction codes; nor Flash memory; Error-correction codes (ECCs); low latency;
  • fLanguage
    English
  • Journal_Title
    Device and Materials Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2009.2031171
  • Filename
    5272510