Title :
Simulation of Light Emission From Planar Multilayer OLEDs, Using a Transmission-Line Model
Author :
Savaidis, Stylianos P. ; Stathopoulos, Nikolaos A.
Author_Institution :
Dept. of Electron., Technol. Educ. Inst. (TEI) of Piraeus, Athens, Greece
Abstract :
In this paper, we propose a fast, accurate, and easy to implement transmission-line model, which evaluates light emission from planar multilayer OLED devices. Total radiated power and radiation patterns of OLED devices are calculated adopting the classic consideration, which relates photon emission in the active layer with the power that is radiated by a randomly oriented dipole antenna. The simulation model considers the under study configurations as equivalent electric and magnetic transmission lines in Fourier space, which are excited by voltage or current sources properly calculated. The proposed model demonstrates also an inherent ability to calculate the waveguided modes and can be also easily transformed to tackle problems of material inhomogeneity and nonlinearity. The accuracy of the transmission-line model has been verified against alternative but also exact calculation methods. Finally, numerical results are provided and discussed for OLED devices, which are constructed by materials with a complex refractive index and emit light within a zone inside the active layer.
Keywords :
antenna radiation patterns; dipole antennas; multilayers; organic light emitting diodes; Fourier space; equivalent electric transmission lines; equivalent magnetic transmission lines; light emission; planar multilayer OLED; radiation patterns; randomly oriented dipole antenna; refractive index; total radiated power; transmission-line model; Antenna radiation patterns; Dipole antennas; Magnetic materials; Magnetic multilayers; Nonhomogeneous media; Organic light emitting diodes; Power transmission lines; Refractive index; Transmission lines; Voltage; Optical microcavity; organic light-emitting diode (OLED); transmission-line model (TLM);
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.2009.2021277