DocumentCode :
1489835
Title :
Influence of local anisotropy fluctuation on soft magnetic properties of the sputtered Fe-Si-Al alloy films
Author :
Takahashi, M. ; Kato, N. ; Shimatsu, T. ; Shoji, H. ; Wakiyama, T.
Author_Institution :
Dept. of Electron. Eng., Tohoku Univ., Sendai, Japan
Volume :
24
Issue :
6
fYear :
1988
fDate :
11/1/1988 12:00:00 AM
Firstpage :
3084
Lastpage :
3086
Abstract :
Effective permeability, μeff, uniaxial anisotropy field, Hk, and local anisotropy fluctuation represented as magnetic ripple, SA-5/8 (S is the structure constant and A-5/8 is a coefficient equal to the power of the exchanges stiffness constant), were systematically studied as a function of composition and film thickness for Fe-Si-Al ternary alloy films. The influence of Hk and SA-5/8 on μeff is discussed in connection with the film structure. The magnitude of μeff was found to depend strongly on the magnitude of microscopic local anisotropy fluctuation. A decrease of the film thickness caused a marked increment in SA-5/8 due to the change of the preferred grain orientation from (110) to (110)+(100) texture. To realize high μeff for Fe-Si-Al films in the high-frequency region, it is concluded that a homogeneous preferred grain orientation is important
Keywords :
aluminium alloys; crystal microstructure; ferromagnetic properties of substances; iron alloys; magnetic anisotropy; magnetic permeability; magnetic thin films; silicon alloys; sputtered coatings; Fe-Si-Al alloy films; film structure; film thickness; local anisotropy fluctuation; magnetic ripple; permeability; preferred grain orientation; soft magnetic properties; texture; uniaxial anisotropy field; Anisotropic magnetoresistance; Fluctuations; Frequency; Magnetic anisotropy; Magnetic films; Magnetic force microscopy; Magnetic properties; Permeability; Perpendicular magnetic anisotropy; Soft magnetic materials;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.92342
Filename :
92342
Link To Document :
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