Title :
Overwrite characteristics in partial penetration recording
Author :
Yamamori, K. ; Tanaka, T.
Author_Institution :
Toshiba Corp., Yokosuka, Japan
fDate :
11/1/1988 12:00:00 AM
Abstract :
The critical medium coating thickness for saturation recording and partial-penetration recording was experimentally investigated. It was found that less than about 0.4-μm coating thickness is necessary for saturation recording at 35 kFRPI. The effects of overwrite modulation (OWM) on recording characteristics were also examined. OWM affected peak-shift in the saturation recording, and extra bits were produced in the partial-penetration recording. A pre-erase method, which is suitable for partial-penetration recording, is discussed
Keywords :
magnetic recording; critical medium coating thickness; overwrite modulation; partial penetration recording; peak-shift; pre-erase method; saturation recording; Coatings; Coercive force; Commercialization; Disk recording; Ferrites; Magnetic heads; Magnetic particles; Magnetization; Paints; Solids;
Journal_Title :
Magnetics, IEEE Transactions on