Overwrite in thin media measured by the method of pseudorandom sequences

Author

Palmer, Dean ; Coker, Jonathan ; Meyer, Michael ; Ziperovich, Pablo

Author_Institution

Compact Storage Lab., IBM ABS, Rochester, MN, USA

Volume

24

Issue

6

fYear

1988

fDate

11/1/1988 12:00:00 AM

Firstpage

3096

Lastpage

3098

Abstract

The method of pseudorandom sequence channel identification is applied to the measurement of bit shift due to overwrite in magnetic recording. The experimental results are compared to results of other overwrite measurement techniques. The proposed method has the advantage of simultaneously quantifying the bit shift due to overwrite and that due to other nonlinear effects. A simple magnetic model is proposed to explain the main features of the overwrite phenomenon. The bit shift is attributed to the interaction of the magnetic field produced by the head and the demagnetizing fields in the media produced during the write process

Keywords

magnetic recording; magnetic thin film devices; bit shift; demagnetizing fields; magnetic field; magnetic model; magnetic recording; overwrite; pseudorandom sequence channel identification; thin media; Amplitude modulation; Frequency domain analysis; Frequency measurement; Interference; Position measurement; Random sequences; Spectral analysis; Time domain analysis; Time measurement; Timing;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.92346

Filename

92346