• DocumentCode
    1489979
  • Title

    Characterization of wavelength-selective fiber-optic devices using a modified phase-shift method

  • Author

    Simova, E. ; Berini, P. ; Grover, C.P.

  • Author_Institution
    Inst. for Nat. Meas. Stand., Nat. Res. Council of Canada, Ottawa, Ont., Canada
  • Volume
    19
  • Issue
    5
  • fYear
    2001
  • fDate
    5/1/2001 12:00:00 AM
  • Firstpage
    717
  • Lastpage
    731
  • Abstract
    We present a novel measurement setup that can be used for the complete characterization of fiber Bragg gratings and wavelength selective fiber-optic devices. Our setup is based on the phase-shift method (PSM), which we have modified to include the measurement of polarization-induced effects such as polarization-dependant loss (PDL) and polarization-mode dispersion (PMD). We measure the spectral response of devices used in transmission and in reflection, the wavelength dependency of the group delays due to chromatic and polarization-mode dispersion, and the wavelength dependency of the polarization-dependent loss. Experimental results are presented and sources of error are discussed. Comparisons with the Jones matrix eigenanalysis method for the measurement of PDL and differential group delay due to PMD have been carried out
  • Keywords
    Bragg gratings; delays; matrix algebra; measurement by laser beam; optical fibre dispersion; optical fibre losses; optical fibre polarisation; optical fibre testing; Jones matrix eigenanalysis method; chromatic dispersion; complete characterization; differential group delay; fiber Bragg gratings; group delays; modified phase-shift method; phase-shift method; polarization-dependant loss; polarization-dependent loss; polarization-induced effects; polarization-mode dispersion; spectral response; wavelength dependency; wavelength selective fiber-optic devices; wavelength-selective fiber-optic devices; Loss measurement; Optical fiber devices; Optical fiber polarization; Page description languages; Phase measurement; Polarization mode dispersion; Propagation delay; Propagation losses; Reflection; Wavelength measurement;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/50.923485
  • Filename
    923485