Title :
Sensitivity of AMSR-E Brightness Temperatures to the Seasonal Evolution of Lake Ice Thickness
Author :
Kang, Kyung-Kuk ; Duguay, Claude R. ; Howell, Stephen E L ; Derksen, Chris P. ; Kelly, Richard E J
Author_Institution :
Dept. of Geogr. & Environ. Manage., Univ. of Waterloo, Waterloo, ON, Canada
Abstract :
The sensitivity of brightness temperature (TB) at 6.9, 10.7, and 18.7 GHz from Advanced Microwave Scanning Radiometer-Earth Observing System (AMSR-E) observations is investigated over five winter seasons (2002-2007) on Great Bear Lake and Great Slave Lake, Northwest Territories, Canada. The TB measurements are compared to ice thicknesses obtained with a previously validated thermodynamic lake ice model. Lake ice thickness is found to explain much of the increase of TB at 10.7 and 18.7 GHz. TB acquired at 18.7 GHz (V-pol) and 10.7 GHz (H-pol) shows the strongest relation with simulated lake ice thickness over the period of study (R2 > 0.90). A comparison of the seasonal evolution of TB for a cold winter (2003-2004) and a warm winter (2005-2006) reveals that the relationship between TB and ice growth is stronger in the cold winter (2003-2004). Overall, this letter shows the high sensitivity of TB to ice growth and, thus, the potential of AMSR-E mid-frequency channels to estimate ice thickness on large northern lakes.
Keywords :
atmospheric temperature; ice; lakes; remote sensing; AD 2002 to 2007; AMSR-E data; Advanced Microwave Scanning Radiometer-Earth Observing System; Canada; Great Bear Lake; Great Slave Lake; Northwest Territories; brightness temperature sensitivity; frequency 10.7 GHz; frequency 18.7 GHz; frequency 6.9 GHz; lake ice thickness; seasonal evolution; Brightness temperature; Earth Observing System; Electromagnetic heating; Ice surface; Ice thickness; Lakes; Microwave radiometry; Snow; Thermodynamics; Thickness measurement; Advanced Microwave Scanning Radiometer—Earth Observing System (EOS) (AMSR-E); brightness temperature; ice thickness; lakes; radiometry;
Journal_Title :
Geoscience and Remote Sensing Letters, IEEE
DOI :
10.1109/LGRS.2010.2044742