Title :
Generation of Two-Dimensional Optical Reference Signals Based on Parametric Minimum Cross Entropy
Author :
Su, Yi-Sheng ; Wu, Tsung-Cheng ; Wang, Chung-Hsuan ; Chang, Min-Kuan
Author_Institution :
Dept. of Comput. Sci. & Inf. Eng., Chang Jung Christian Univ., Tainan, Taiwan
fDate :
6/15/2011 12:00:00 AM
Abstract :
In this letter, a novel design of two-dimensional (2-D) zero reference codes (ZRCs) based on parametric minimum cross entropy (PMCE) is proposed to generate 2-D optical zero reference signals (ZRSs) with low second maximum for grating alignment systems. An optical ZRS is necessary to obtain an absolute measurement in grating alignment systems. A method to acquire an optical ZRS is by means of illuminating two identical superimposed ZRCs. Because the movement between the two ZRCs is in two-axis, 2-D ZRCs are required. However, they are hard to design due to the high computational complexity, especially for large codes. The proposed PMCE method not only reduces the second maximum of 2-D optical ZRSs, but also decreases the computational complexity. Simulation results indicate that there are 8.33% ~ 22.22% reductions in the second maximum of several 2-D optical ZRSs, as compared with those of the recently proposed cross-entropy (CE) method. The PMCE method proves to be a powerful tool for the design of 2-D ZRCs.
Keywords :
computational complexity; entropy; optical harmonic generation; 2D optical zero reference signals; computational complexity; cross-entropy method; grating alignment systems; parametric minimum cross entropy; two-dimensional optical reference signals generation; two-dimensional zero reference codes; Computational complexity; Correlation; Entropy; Nonlinear optics; Optical diffraction; Optical sensors; Pixel; Autocorrelation function; combinatorial optimization; optical position measurement; optimization method; parametric minimum cross entropy (PMCE); two-dimensional (2-D) optical zero reference signal (ZRS); two-dimensional (2-D) zero reference code (ZRC);
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2011.2140368