DocumentCode :
1490680
Title :
Study of the Variance of Parametric Estimates of the Best Linear Approximation of Nonlinear Systems
Author :
Schoukens, Johan ; Pintelon, Rik
Author_Institution :
Dept. of Electr. Meas. (ELEC), Vrije Univ. Brussel, Brussels, Belgium
Volume :
59
Issue :
12
fYear :
2010
Firstpage :
3159
Lastpage :
3167
Abstract :
Abstract-This paper analyzes the variance of the estimated parametric best linear approximation (BLA) ĜBLA(q,θ) of a nonlinear system that is driven by random excitations. The estimated model ĜBLA(q; θ) varies not only due to the disturbing measurement and process noise but also over different realizations of the random excitation because the nonlinear distortions depend on the input realization. For the nonparametric frequency response function (FRF) estimate, it has been shown that the variance expression is still valid in the presence of nonlinear distortions, and the same formulas can be used in the linear as in the nonlinear case. This result does not hold for the variance σ(ĜBLA(q,θ))2 on the parametric estimate ĜBLA(q,θ). It is shown in this paper that it is still possible to upperbound the variance σ(ĜBLA(q,θ))2 using linear expression by introducing an additional scaling factor that depends upon the maximal degree of nonlinearity.
Keywords :
approximation theory; frequency response; nonlinear distortion; nonlinear systems; nonparametric statistics; parameter estimation; disturbing measurement; linear expression; nonlinear distortion; nonlinear system; nonparametric frequency response function; parametric best linear approximation system; parametric estimate variance expression; process noise; scaling factor; Analysis of variance; Distortion measurement; Frequency estimation; Frequency response; Government; Linear approximation; Noise measurement; Nonlinear distortion; Nonlinear systems; Uncertainty; Best linear approximation (BLA); nonlinear systems; parametric modeling; under estimation; variance;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2010.2047139
Filename :
5464379
Link To Document :
بازگشت