• DocumentCode
    1491016
  • Title

    Collection efficiency of photoelectrons injected into dense ar gas at low and intermediate temperatures

  • Author

    Borghesani, A.F. ; Lamp, P.

  • Author_Institution
    Dept. of Phys., Univ. of Padua, Padua, Italy
  • Volume
    19
  • Issue
    2
  • fYear
    2012
  • fDate
    4/1/2012 12:00:00 AM
  • Firstpage
    689
  • Lastpage
    696
  • Abstract
    We measured the collection efficiency of electrons injected by means of photoelectric effect into argon gas at high density at temperatures T=177.3 K, above the critical temperature, and T=142.6 K, below it, for several densities as a function of the applied electric field. We show that the experimental data can be interpreted in terms of the Young-Bradbury model if we take into account the multiple scattering effects that affect the electron-atom scattering cross section.
  • Keywords
    argon; atom-electron collisions; photoelectricity; transport processes; Ar; Young-Bradbury model; applied electric field; electron-atom scattering cross section; intermediate temperature dense argon gas; low temperature dense argon gas; multiple scattering effects; photoelectric effect; photoelectron collection efficiency; temperature 142.6 K; temperature 177.3 K; Anodes; Argon; Cathodes; Electric fields; Scattering; Temperature measurement; Charge transport; dense noble gases; multiple scattering; scattering cross section;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2012.6180264
  • Filename
    6180264