DocumentCode :
1491905
Title :
Conference Reports
Author :
Kapur, Rohit
Author_Institution :
Synopsys
Volume :
27
Issue :
3
fYear :
2010
Firstpage :
75
Lastpage :
75
Abstract :
Conference Reports
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2010.64
Filename :
5465127
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1491905
