Title :
Concurrent checking for logic [review of "New Methods of Concurrent Checking (Goessel, M., et al; 2008)]
Author_Institution :
Sun Microsystems
Abstract :
This is a review of New Methods of Concurrent Checking (by Michael Goessel, Vitaly Ocheretny, Egor Sogomonyan, and Daniel Marienfeld).
Keywords :
Aging; Books; Circuit faults; Circuit testing; Error correction; Error correction codes; Fault detection; Logic; Redundancy; System testing; concurrent checking; self-checking logic;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2010.63
