DocumentCode :
1491933
Title :
Test Technology TC Newsletter
Volume :
27
Issue :
3
fYear :
2010
Firstpage :
78
Lastpage :
79
Abstract :
This month´s Test Technology TC Newsletter features highlights of past events—11th IEEE Latin-American Test Workshop; Design, Automation and Test in Europe (DATE 2010)—and upcoming events: 3rd IEEE International Symposium on Hardware, and the 16th IEEE International Mixed-Signals, Sensors, and Systems Test Workshop.
Keywords :
DATE 2010; HOST 2010; IMS3TW 2010; LATW 2010;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2010.72
Filename :
5465131
Link To Document :
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