Title :
SSO noise electrical performance limitations for PQFP packages
Author :
Lin, Lei ; Prince, John L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ, USA
fDate :
8/1/1997 12:00:00 AM
Abstract :
Factors which affect the simultaneous switching output (SSO) noise electrical performance of plastic quad flat pack (PQFP) packages are discussed in this paper. Limitations on PQFP package design for SSO noise are presented, along with a methodology for extracting the effective inductance limits for PQFP packages
Keywords :
inductance; integrated circuit noise; integrated circuit packaging; plastic packaging; PQFP packages; effective inductance limits; electrical performance limitations; package design; plastic quad flat pack; simultaneous switching output noise; Circuit noise; Circuit testing; Conductors; Costs; Driver circuits; Electronics packaging; Inductance; Pins; Plastic packaging; Semiconductor device noise;
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on
