• DocumentCode
    1492219
  • Title

    High-frequency distortion analysis of analog integrated circuits

  • Author

    Wambacq, Piet ; Gielen, Georges G E ; Kinget, Peter R. ; Sansen, Willy

  • Author_Institution
    Dept. of Elektrotech., Katholieke Univ., Leuven, Belgium
  • Volume
    46
  • Issue
    3
  • fYear
    1999
  • fDate
    3/1/1999 12:00:00 AM
  • Firstpage
    335
  • Lastpage
    345
  • Abstract
    An approach is presented for the analysis of the nonlinear behavior of analog integrated circuits. The approach is based on a variant of the Volterra series approach for frequency domain analysis of weakly nonlinear circuits with one input port, such as amplifiers, and with more than one input port, such as analog mixers and multipliers. By coupling numerical results with symbolic results, both obtained with this method, insight into the nonlinear operation of analog integrated circuits can be gained. For accurate distortion computations, the accuracy of the transistor models is critical. A MOS transistor model is discussed that allows us to explain the measured fourth-order nonlinear behavior of a 1 GHz CMOS upconverter. Further, the method is illustrated with several examples, including the analysis of an operational amplifier up to its gain-bandwidth product. This example has also been verified experimentally
  • Keywords
    Volterra series; analogue integrated circuits; electric distortion; equivalent circuits; frequency convertors; frequency-domain analysis; harmonic distortion; mixers (circuits); nonlinear distortion; nonlinear network analysis; operational amplifiers; 1 GHz; CMOS upconverter; HF distortion analysis; MOSFET model; Volterra series approach; analog integrated circuits; distortion computations; fourth-order nonlinear behavior; frequency domain analysis; high-frequency distortion; nonlinear behavior; op amp analysis; operational amplifier; transistor models; weakly nonlinear circuits; Analog integrated circuits; Coupling circuits; Distortion measurement; Frequency domain analysis; Integrated circuit measurements; MOSFETs; Nonlinear circuits; Nonlinear distortion; Operational amplifiers; Semiconductor device modeling;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1057-7130
  • Type

    jour

  • DOI
    10.1109/82.754866
  • Filename
    754866