• DocumentCode
    149239
  • Title

    Performance estimation of a thin-film photovoltaic plant based on an Artificial Neural Network model

  • Author

    Graditi, Giorgio ; Ferlito, Sergio ; Adinolfi, Giovanna ; Tina, Giuseppe Marco ; Ventura, Cristina

  • Author_Institution
    ENEA - Res. Center, Italian Nat. agency for new Technol., Portici, Italy
  • fYear
    2014
  • fDate
    25-27 March 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    An Artificial Neural Network (ANN) approach is used to estimate power production yield by a 1 kWp experimental micro-morph silicon modules plant located at ENEA Portici Research Centre, in Italy South region. A large dataset consisting of data, measured every five minutes and acquired from 2006 to 2012, is used for the training/test of the ANN. First, AC power production evaluation is obtained from single-hidden layer Multi-Layer Perceptron (MPL) Neural Network with two inputs consisting in ambient temperature and solar global radiation. In order to improve the approximation of the AC power, the clear sky solar radiation is then added as input of the ANN. Experimental data are reported to demonstrate the feasibility and the potentiality of the adopted solutions.
  • Keywords
    elemental semiconductors; neural nets; photovoltaic power systems; power engineering computing; silicon; solar radiation; AC power production; ENEA Portici Research Centre; Italy south region; MPL; Si; ambient temperature; artificial neural network; clear sky solar radiation; micromorph silicon modules plant; multilayer perceptron; power production yield; single-hidden layer; solar global radiation; thin film photovoltaic plant; Approximation methods; Artificial neural networks; Numerical models; Production; Silicon; Temperature measurement; Training; Artificial Neural Network; MLP; photovoltaic production;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Renewable Energy Congress (IREC), 2014 5th International
  • Conference_Location
    Hammamet
  • Print_ISBN
    978-1-4799-2196-6
  • Type

    conf

  • DOI
    10.1109/IREC.2014.6826954
  • Filename
    6826954