DocumentCode :
149239
Title :
Performance estimation of a thin-film photovoltaic plant based on an Artificial Neural Network model
Author :
Graditi, Giorgio ; Ferlito, Sergio ; Adinolfi, Giovanna ; Tina, Giuseppe Marco ; Ventura, Cristina
Author_Institution :
ENEA - Res. Center, Italian Nat. agency for new Technol., Portici, Italy
fYear :
2014
fDate :
25-27 March 2014
Firstpage :
1
Lastpage :
6
Abstract :
An Artificial Neural Network (ANN) approach is used to estimate power production yield by a 1 kWp experimental micro-morph silicon modules plant located at ENEA Portici Research Centre, in Italy South region. A large dataset consisting of data, measured every five minutes and acquired from 2006 to 2012, is used for the training/test of the ANN. First, AC power production evaluation is obtained from single-hidden layer Multi-Layer Perceptron (MPL) Neural Network with two inputs consisting in ambient temperature and solar global radiation. In order to improve the approximation of the AC power, the clear sky solar radiation is then added as input of the ANN. Experimental data are reported to demonstrate the feasibility and the potentiality of the adopted solutions.
Keywords :
elemental semiconductors; neural nets; photovoltaic power systems; power engineering computing; silicon; solar radiation; AC power production; ENEA Portici Research Centre; Italy south region; MPL; Si; ambient temperature; artificial neural network; clear sky solar radiation; micromorph silicon modules plant; multilayer perceptron; power production yield; single-hidden layer; solar global radiation; thin film photovoltaic plant; Approximation methods; Artificial neural networks; Numerical models; Production; Silicon; Temperature measurement; Training; Artificial Neural Network; MLP; photovoltaic production;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Renewable Energy Congress (IREC), 2014 5th International
Conference_Location :
Hammamet
Print_ISBN :
978-1-4799-2196-6
Type :
conf
DOI :
10.1109/IREC.2014.6826954
Filename :
6826954
Link To Document :
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