Title :
Algorithm for generating optimal tests for exclusive-OR networks
Author :
Debany, W.H. ; Hartmann, C.R.P. ; Snethen, T.J.
fDate :
3/1/1991 12:00:00 AM
Abstract :
An algorithm is presented for generating minimal-cardinality test sets for logic networks composed of exclusive-OR gates arranged in a structure that can be described in the form of a connected acyclic graph. It is assumed that 2" unique input combinations are required to test an n-input (n>or=2) exclusive-OR gate. The algorithm requires no lookup tables. The method is suitable for automation but can also be performed manually even for large networks\´.
Keywords :
logic circuits; logic testing; connected acyclic graph; exclusive-OR networks; generating optimal tests; logic networks; minimal-cardinality test sets;
Journal_Title :
Computers and Digital Techniques, IEE Proceedings E
