DocumentCode :
1492418
Title :
Multiple-valued static CMOS memory cell
Author :
Çilingiroglu, Ugur ; Özelci, Yaman
Author_Institution :
Dept. of Electron. & Commun. Eng., Istanbul Tech. Univ., Turkey
Volume :
48
Issue :
3
fYear :
2001
fDate :
3/1/2001 12:00:00 AM
Firstpage :
282
Lastpage :
290
Abstract :
The conventional flip-flop core is generalized to multistability in full static CMOS without compromising the standard binary CMOS features such as ratioless device sizing, negligible static power consumption, and wide noise margins. The proposed multiple-level cell is built with eight devices for three-level operation and necessitates four more devices for each additional level. It can be arranged with a proper address scheme to function as a RAM cell, D-latch, or synaptic memory. Experimental work verifies four-level operation with 3-V supply. Simulations indicate the possibility of six-level storage in 5-V operation. The cell retains noise margins one threshold voltage wide even at such high-level operation. This is made possible by exploiting the dynamic hysteresis associated with the transfer characteristic of an inverter operating with very low rail-to-rail voltage
Keywords :
CMOS memory circuits; flip-flops; low-power electronics; multivalued logic circuits; random-access storage; 3 V; 5 V; D-latch; RAM; dynamic hysteresis; flip-flop; inverter; low-power circuit; multiple-valued static CMOS memory cell; noise margin; synaptic memory; threshold voltage; transfer characteristics; CMOS logic circuits; Flip-flops; Fuzzy logic; Hysteresis; Inverters; Logic devices; Neural networks; Random access memory; Read-write memory; Threshold voltage;
fLanguage :
English
Journal_Title :
Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on
Publisher :
ieee
ISSN :
1057-7130
Type :
jour
DOI :
10.1109/82.924070
Filename :
924070
Link To Document :
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