DocumentCode
1492545
Title
Large-scale fabrication of titanium-rich perovskite PZT submicro/nano wires and their electromechanical properties
Author
Wang, Jin ; Sandu, Cosmin Silviu ; Setter, Nava
Author_Institution
Ceramics Lab., Swiss Fed. Inst. of Technol., Lausanne, Switzerland
Volume
56
Issue
9
fYear
2009
fDate
9/1/2009 12:00:00 AM
Firstpage
1813
Lastpage
1819
Abstract
We report a 2-step approach to prepare tetragonal perovskite PbZr0.1Ti0.9O3 submicro/nano wires in gram scale and with over 95% wire content. Non-perovskite precursor wires were first fabricated by hydrothermal processing. A subsequent annealing in a PbO atmosphere at 600degC converted these wires into perovskite structures which retain the one-dimensional shape. Binding of the perovksite nanowires to a conductive substrate could be achieved by a similar heat treatment of the non-perovskite precursor wires on a flat Pt coated substrate. Taking advantage of the strong mechanical attachment and good electrical contact between the wires and the metallic layer, piezoresponse force microscopy (PFM) was used to measure the local piezoelectric and ferroelectric properties of the individual wires. Enhanced piezoelectric response relative to sputtered epitaxial PbZr0.2Ti0.8O3 film and squared hysterisis loop with sharp switching indicate pronounced electro- mechanical and ferroelectric behavior. The 90deg domain structure of the as-prepared perovskite PZT wires was confirmed by both PFM and transmission electron microscopy investigations.
Keywords
annealing; dielectric hysteresis; electric domains; electrical contacts; electromechanical effects; epitaxial layers; ferroelectric switching; ferroelectric thin films; lead compounds; nanofabrication; nanowires; piezoelectricity; transmission electron microscopy; zirconium compounds; PbZr0.2Ti0.8O3; conductive substrate; domain structure; electrical contact; electromechanical property; ferroelectric property; hydrothermal processing; hysterisis loop; piezoelectric property; piezoresponse force microscopy; sharp switching; sputtered epitaxial film; temperature 600 degC; titanium-rich perovskite PZT submicro/nano wires; transmission electron microscopy; Annealing; Atmosphere; Fabrication; Ferroelectric materials; Force measurement; Large-scale systems; Nanowires; Shape; Substrates; Wires;
fLanguage
English
Journal_Title
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher
ieee
ISSN
0885-3010
Type
jour
DOI
10.1109/TUFFC.2009.1254
Filename
5278428
Link To Document