DocumentCode :
1492717
Title :
Physical Science, Measurement and Instrumentation, Management and Education, IEE Proceedings A
Author :
Michael, D.H. ; Collins, R.
Author_Institution :
Dept. of Mech. Eng., Univ. Coll. London, UK
Volume :
137
Issue :
3
fYear :
1990
fDate :
5/1/1990 12:00:00 AM
Firstpage :
131
Lastpage :
134
Abstract :
The authors are concerned with the mathematical modelling of the surface distribution of thin-skin electromagnetic fields in the neighbourhood of surface breaking cracks in conductors. Mathematical solutions are given for the edge distributions in the Born limit, which supplement previous solutions derived for the edge distributions in the Laplacian limit of the surface fields.
Keywords :
conductors (electric); crack detection; eddy current testing; eddy currents; surface potential; Born limit; EM fields; Laplacian limit; conductors; edge distributions; surface breaking cracks; surface distribution; surface fields; thin-skin eddy-current fields;
fLanguage :
English
Journal_Title :
Physical Science, Measurement and Instrumentation, Management and Education, IEE Proceedings A
Publisher :
iet
ISSN :
0143-702X
Type :
jour
Filename :
52785
Link To Document :
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