Title :
Complex permittivity determination from propagation constant measurements
Author :
Janezic, Michael D. ; Jargon, Jeffrey A.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fDate :
2/1/1999 12:00:00 AM
Abstract :
The authors present a new transmission line method for measuring the complex permittivity of dielectric materials using propagation constant measurements. In contrast to previous methods, a network analyzer calibration is unnecessary since calibrated scattering parameters are not required. They use measurements in X-band waveguide to show that this technique compares well with the transmission/reflection and cylindrical cavity methods
Keywords :
microwave measurement; permittivity measurement; X-band waveguide; complex permittivity determination; dielectric materials; propagation constant measurements; transmission line method; Dielectric materials; Dielectric measurements; Eigenvalues and eigenfunctions; Permittivity measurement; Propagation constant; Scattering parameters; Transmission line matrix methods; Transmission line measurements; Transmission line theory; Waveguide components;
Journal_Title :
Microwave and Guided Wave Letters, IEEE
