Title :
Interference faults testing for time switches
Author_Institution :
Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada
fDate :
7/1/1990 12:00:00 AM
Abstract :
A detection scheme for coupling faults for integrated digital time-division switches is proposed. It is shown that a low overhead is necessary to improve fault detectability. Based on the proposed augmentation of a standard time switch, a new test procedure that possesses the following properties is developed: it guarantees a detection of all possible coupling faults in both data and control memory, and the number of tests is minimal
Keywords :
electronic equipment testing; electronic switching systems; fault location; switching networks; time division multiplexing; control memory; coupling faults; data memory; detection scheme; fault detectability; integrated digital time-division switches; interference faults testing; Circuit faults; Communication switching; Communication system control; Coupling circuits; Fault detection; Interference; Phase change materials; Read-write memory; Switches; Testing;
Journal_Title :
Communications, IEEE Transactions on
