• DocumentCode
    1493135
  • Title

    All-NbN nanobridges as Josephson mixers

  • Author

    Matsui, T. ; Wang, Zhen ; Hamasaki, K. ; Yamashita, T. ; Endo, M.

  • Author_Institution
    Commun. Res. Lab., Minist. of Post & Telecommun., Tokyo, Japan
  • Volume
    25
  • Issue
    2
  • fYear
    1989
  • fDate
    3/1/1989 12:00:00 AM
  • Firstpage
    1068
  • Lastpage
    1071
  • Abstract
    Using RIE (reactive in etching) and lift-off techniques, all-NbN nanobridges with gap structure in the I-V (current-voltage) curves have been reproducibly constructed for testing as millimeter-wave mixers. The nanobridges were constructed on NbN/MgO/NbN edge junctions. They were characterized by measurements of their I-V curve and dI/dV versus V and by mixing experiments at 105.9 GHz. These devices had high normal-state resistance, and showed almost ideal Josephson response to external magnetic flux and to millimeter-wave irradiation. The I -V curve remained nonhysteretic from Tc to 4.2 K, and millimeter-wave-induced steps in the I-V curve were observed up to ~3 mV. The cooling of the NbN nanobridges was quite good due to their small size and VTB geometry and the high thermal conductivity of the MgO films. Hence the Josephson response of these devices to millimeter waves was comparatively less limited by self-heating
  • Keywords
    Josephson effect; magnesium compounds; mixers (circuits); niobium compounds; solid-state microwave devices; sputter etching; superconducting junction devices; type II superconductors; 105.9 GHz; 4.2 K; EHF; I-V curve; Josephson mixers; MM-wave device; NbN-MgO-NbN edge junctions; RIE; VTB geometry; gap structure; lift-off techniques; microwave device; millimeter-wave mixers; reactive in etching; superconducting junction device; Cooling; Electrical resistance measurement; Etching; Geometry; Magnetic flux; Millimeter wave measurements; Millimeter wave technology; Nanostructures; Testing; Thermal conductivity;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.92473
  • Filename
    92473