• DocumentCode
    1493318
  • Title

    Dielectric measurements for power electronic applications

  • Author

    Strydom, Johan Tjeerd ; Van Wyk, Jacobus Daniel ; Ferreira, Jan Abraham

  • Author_Institution
    Bradley Dept. of Electr. & Comput. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
  • Volume
    37
  • Issue
    3
  • fYear
    2001
  • Firstpage
    829
  • Lastpage
    839
  • Abstract
    Capacitors are utilized in a variety of different ways in power electronic circuits. Typical applications are in snubber, clamping, and resonant circuits. For design purposes, it is necessary to make an accurate measurement of the actual behavior of the capacitance that is added to the circuit under conditions related to those prevailing in a converter. For this purpose, a number of different measurement systems or techniques can be utilized. Four of these measurement systems are compared. These are small-signal variable-frequency measurement, large-signal quasi-DC measurement, in-situ high-voltage measurement and small-signal with large DC bias voltage measurement. Each of these measurement techniques returns characteristic values based on its particular model of the test capacitor. These tests are done on both ceramic and nonceramic capacitors at room temperature. The results are discussed
  • Keywords
    capacitors; dielectric measurement; electron device testing; frequency measurement; power electronics; voltage measurement; ceramic capacitors; clamping circuits; dielectric measurements; in-situ high-voltage measurement; large-signal quasi-DC measurement; measurement systems; nonceramic capacitors; power electronic applications; resonant circuits; small-signal large DC bias voltage measurement; small-signal variable-frequency measurement; snubber circuits; Capacitance measurement; Capacitors; Clamps; Dielectric measurements; Measurement techniques; Power electronics; RLC circuits; Snubbers; Testing; Voltage measurement;
  • fLanguage
    English
  • Journal_Title
    Industry Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-9994
  • Type

    jour

  • DOI
    10.1109/28.924765
  • Filename
    924765