Title :
On a GaN-Based Light-Emitting Diode With a p-GaN/i-InGaN Superlattice Structure
Author :
Liu, Yi-Jung ; Yen, Chih-Hung ; Chen, Li-Yang ; Tsai, Tsung-Han ; Tsai, Tsung-Yuan ; Liu, Wen-Chau
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng-Kung Univ., Tainan, Taiwan
Abstract :
An interesting GaN-based light-emitting diode (LED) with a ten-period i-InGaN/p-GaN (5-nm/5-nm) superlattice (SL) structure, inserted between a multiple-quantum-well structure and a p-GaN layer, is fabricated and studied. This inserted SL can be regarded as a confinement layer of holes to enhance the hole injection efficiency. As compared with a conventional LED device without the SL structure, the studied LED exhibits better current-spreading performance and an improved quality. The turn-on voltage, at 20 mA, is decreased from 3.32 to 3.14 V due to the reduced contact resistance as well as the more uniformity of carrier injection. A substantially reduced leakage current (10-7-10-9 A) and higher endurance of the reverse current pulse are found. As compared with the conventional LED without the SL structure, the significant enhancement of 25.4% in output power and the increment of 5% in external quantum efficiency are observed.
Keywords :
III-V semiconductors; gallium compounds; indium compounds; leakage currents; light emitting diodes; semiconductor quantum wells; semiconductor superlattices; wide band gap semiconductors; GaN-InGaN; LED; carrier injection uniformity; current 20 mA; current-spreading performance; external quantum efficiency; hole confinement layer; hole injection efficiency; leakage current; light-emitting diode; multiple-quantum-well structure; output power; p-GaN layer; p-i superlattice structure; reverse current pulse; size 5 nm; turn-on voltage; Current spreading; GaN; electrostatic discharge (ESD); hole confinement; superlattice (SL);
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2009.2030140