• DocumentCode
    1493666
  • Title

    Optically Activated 4H-SiC p-i-n Diodes for High-Power Applications

  • Author

    Zhao, Feng ; Islam, Mohammad M. ; Muzykov, Peter ; Bolotnikov, Alex ; Sudarshan, Tangali S.

  • Author_Institution
    Electr. Eng. Dept., Univ. of South Carolina, Columbia, SC, USA
  • Volume
    30
  • Issue
    11
  • fYear
    2009
  • Firstpage
    1182
  • Lastpage
    1184
  • Abstract
    To realize the benefits of SiC power electronics and optically controlled device technology, we present in this letter optically activated SiC p-i-n diodes for high-temperature and high-power applications. The diodes were fabricated on an n-type 4H-SiC substrate, and measurements show that, when tested at a reverse bias of 1000 V, the diode was switched on by a single UV (337.1 nm) laser pulse with 1.2-mJ optical energy. The FWHM is about 180 ns with a rise time of less than 10 ns and a fall time of about 200 ns. The response time is primarily limited by the RC time constant from the junction capacitance of the diode and the current-limiting resistor in the test circuit. This initial work forms the basis for the further development of high-power high-speed SiC bistable switches.
  • Keywords
    p-i-n diodes; power semiconductor diodes; semiconductor device testing; semiconductor materials; silicon compounds; 4H-SiC; RC time constant; SiC; current-limiting resistor; high-power applications; junction capacitance; optical energy; optically activated p-i-n diodes; optically controlled device technology; power electronics; response time; reverse bias; single UV laser pulse; test circuit; voltage 1000 V; wavelength 337.1 nm; Bistable switches; SiC; optically activated; p-i-n diode;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2009.2031419
  • Filename
    5280300