DocumentCode
1493666
Title
Optically Activated 4H-SiC p-i-n Diodes for High-Power Applications
Author
Zhao, Feng ; Islam, Mohammad M. ; Muzykov, Peter ; Bolotnikov, Alex ; Sudarshan, Tangali S.
Author_Institution
Electr. Eng. Dept., Univ. of South Carolina, Columbia, SC, USA
Volume
30
Issue
11
fYear
2009
Firstpage
1182
Lastpage
1184
Abstract
To realize the benefits of SiC power electronics and optically controlled device technology, we present in this letter optically activated SiC p-i-n diodes for high-temperature and high-power applications. The diodes were fabricated on an n-type 4H-SiC substrate, and measurements show that, when tested at a reverse bias of 1000 V, the diode was switched on by a single UV (337.1 nm) laser pulse with 1.2-mJ optical energy. The FWHM is about 180 ns with a rise time of less than 10 ns and a fall time of about 200 ns. The response time is primarily limited by the RC time constant from the junction capacitance of the diode and the current-limiting resistor in the test circuit. This initial work forms the basis for the further development of high-power high-speed SiC bistable switches.
Keywords
p-i-n diodes; power semiconductor diodes; semiconductor device testing; semiconductor materials; silicon compounds; 4H-SiC; RC time constant; SiC; current-limiting resistor; high-power applications; junction capacitance; optical energy; optically activated p-i-n diodes; optically controlled device technology; power electronics; response time; reverse bias; single UV laser pulse; test circuit; voltage 1000 V; wavelength 337.1 nm; Bistable switches; SiC; optically activated; p-i-n diode;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/LED.2009.2031419
Filename
5280300
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