DocumentCode :
1493681
Title :
Optical 2-D Fourier Transform Spectroscopy of Excitons in Semiconductor Nanostructures
Author :
Cundiff, Steven T. ; Bristow, Alan D. ; Siemens, Mark ; Li, Hebin ; Moody, Galan ; Karaiskaj, Denis ; Dai, Xingcan ; Zhang, Tianhao
Author_Institution :
JILA, Univ. of Colorado, Boulder, CO, USA
Volume :
18
Issue :
1
fYear :
2012
Firstpage :
318
Lastpage :
328
Abstract :
Optical 2-D Fourier transform spectroscopy is a powerful technique for studying resonant light-matter interactions, determining the transition structure and monitoring dynamics of optically created excitations. The ability to separate homogeneous and inhomogeneous broadening is one important capability. In this paper, we discuss the use of this technique to study excitonic transitions in semiconductor nanostructures. In quantum wells, the effects of structural disorder is observed as inhomogeneous broadening of the exciton resonances. In quantum dots, the temperature dependence of the homogeneous width gives insight into the nature of the dephasing processes.
Keywords :
Fourier transform spectra; Fourier transform spectroscopy; excitons; nanostructured materials; semiconductor quantum dots; semiconductor quantum wells; spectral line broadening; two-dimensional spectra; two-dimensional spectroscopy; excitonic transitions; homogeneous broadening; inhomogeneous broadening; optical 2-D Fourier transform spectroscopy; optically created excitations; resonant light-matter interactions; semiconductor nanostructures; structural disorder; Excitons; Gallium arsenide; Laser beams; Nonhomogeneous media; Shape; Silicon; Spectroscopy; Semiconductor nanostructures; spectroscopy; ultrafast optics;
fLanguage :
English
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
1077-260X
Type :
jour
DOI :
10.1109/JSTQE.2011.2123876
Filename :
5749680
Link To Document :
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