Title :
Superconducting stripline resonator performance
Author :
McAvoy, B.R. ; Wagner, G.R. ; Adam, J.D. ; Talvacchio, J. ; Driscoll, M.
Author_Institution :
Westinghouse Res. & Dev. Center, Pittsburgh, PA, USA
fDate :
3/1/1989 12:00:00 AM
Abstract :
Reliable techniques for evaluating the microwave properties of superconductors are essential in providing calibrated data for exchange between laboratories and for developing practical device designs. The authors are examining the techniques which utilize microwave stripline resonators. These resonators provide for the rapid measurement of microwave parameters in a repeatable fashion with minimal constraints on processing. Sandwiched microstrip line resonators are used to compare the performance at 4.2 K of OFHC copper and superconducting films of Pb, Nb, and YBa2Cu3O7 (YBCO) at C-band and X-band. Typical results for the Nb resonators show a loaded QL of about 8×104 with a transmission insertion loss of 5 dB at 3 GHz. Initial results on a YBCO a-axis film used as a ground plane in the Nb resonator yield a surface resistance value of about 10 -3 Ω at 2.8 GHz. Preliminary results on the phase noise performance of a Nb resonator at 2.9 GHz are presented
Keywords :
Q-factor; barium compounds; electron device noise; high-temperature superconductors; lead; losses; niobium; resonators; solid-state microwave devices; strip line components; superconducting devices; superconducting thin films; type I superconductors; type II superconductors; yttrium compounds; 10-3 ohm; 2.8 to 3 GHz; 4.2 K; 5 dB; C-band; Cu; Nb; OFHC Cu; Pb; X-band; YBa2Cu3O7; a-axis film; high temperature superconductors; loaded Q-factor; microwave properties; phase noise performance; stripline resonator; surface resistance; transmission insertion loss; Microstrip resonators; Microwave measurements; Microwave theory and techniques; Niobium; Stripline; Superconducting devices; Superconducting films; Superconducting microwave devices; Surface resistance; Yttrium barium copper oxide;
Journal_Title :
Magnetics, IEEE Transactions on
