• DocumentCode
    1493910
  • Title

    A Low-Power Ultrawideband CMOS Power Detector With an Embedded Amplifier

  • Author

    Li, Chaojiang ; Gong, Fei ; Wang, Pingshan

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Clemson Univ., Clemson, SC, USA
  • Volume
    59
  • Issue
    12
  • fYear
    2010
  • Firstpage
    3270
  • Lastpage
    3278
  • Abstract
    A self-biased low-power CMOS power detector (PD) is proposed and demonstrated in this paper. The detector utilizes the nonlinear characteristics of short-channel MOS devices operating in either a saturation or subthreshold regime to generate a dc current that is proportional to the input RF signal power. The operating regimes of MOS devices depend on input RF power levels. A quasi-T-coil matching network providing 50- matching from 0.5 to 20 GHz is designed and analyzed. An embedded amplifier is added to enhance the sensitivity of the PD when the input power level is low. The circuit that is implemented in a 0.13- CMOS process occupies an active area of 0.085 . In the matched frequency range, the measured input dynamic range is 47 dB with an overall sensitivity of 26.8 mV/dB. The output dc voltage response is nearly frequency-independent in the linear operating range, varying by less than 1.9 dB for a given input RF power level, as the RF frequency is swept across the operating frequency range. With a standard 1.2-V supply, the static power consumption is about 0.1 mW, which decreases to with a 0.5-V supply, while the operating frequency remains unchanged.
  • Keywords
    CMOS integrated circuits; amplifiers; low-power electronics; power measurement; embedded amplifier; frequency 0.5 GHz to 20 GHz; low-power ultrawideband CMOS power detector; nonlinear characteristics; power 0.1 mW; short-channel MOS devices; size 0.13 mum; voltage 1.2 V; Character generation; Circuits; DC generators; Detectors; MOS devices; Power generation; Radio frequency; Radiofrequency amplifiers; Signal generators; Ultra wideband technology; Complimentary metal–oxide–semiconductor (CMOS); dynamic range; low power; low voltage; nonlinearity; power detectors (PDs); ultrawideband (UWB);
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2010.2047131
  • Filename
    5466216