DocumentCode :
1494185
Title :
A Physics-Based Approximation for the Polysilicon Thin-Film Transistor Surface Potential
Author :
Deng, Wanling ; Huang, Junkai
Author_Institution :
Dept. of Electron. Eng., Jinan Univ., Guangzhou, China
Volume :
32
Issue :
5
fYear :
2011
fDate :
5/1/2011 12:00:00 AM
Firstpage :
647
Lastpage :
649
Abstract :
A closed-form approximation for the surface potential of partially depleted polysilicon thin-film transistors with an undoped or lightly doped body is developed by including both monoenergetic midgap and exponential band-tail trap states. The proposed scheme provides a complete modeling for surface potential and is computationally efficient, which is critical in compact modeling and circuit simulator applications. Its high accuracy in predicting the surface potential under various bias and trap density conditions has been verified by a comparison with the numerical results.
Keywords :
semiconductor device models; surface potential; thin film transistors; exponential band-tail trap states; monoenergetic midgap; physics-based approximation; polysilicon thin-film transistor surface potential; Approximation methods; Computational modeling; Electric potential; Numerical models; Silicon; Thin film transistors; Compact modeling; polysilicon thin-film transistors (poly-Si TFTs); surface potential;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2011.2118737
Filename :
5750017
Link To Document :
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