Title :
Niobium trilayer process for superconducting circuits
Author :
Murduck, J.M. ; Porter, J. ; Dozier, W. ; Sandell, R. ; Burch, J. ; Bulman, J. ; Dang, C. ; Lee, L. ; Chan, H. ; Simon, R.W. ; Silver, A.H.
Author_Institution :
TRW Space & Technol. Group, Redondo Beach, CA, USA
fDate :
3/1/1989 12:00:00 AM
Abstract :
A Nb-AlOx-Nb trilayer process was developed that consistently produces junctions with Vm>40 mV. Critical current density was controlled reproducibly from 200 to 7000 A/cm2 by controlling the oxygen pressure in the process chamber during thermal oxidation of the aluminum. A multilayer AlOx barrier was used to produce junctions for Josephson circuit applications requiring low critical currents (<50 A/cm2). A second Al deposition and oxidation was able to reproducibly control the critical current density from 6 to 200 A/cm2. High quality (Vm>40 mV) Josephson junctions have been fabricated with low stress (<1 Gdyne/cm2) by an appropriate choice of niobium deposition rate (8 to 9 Å/s) and argon sputtering pressure (4 mtorr)
Keywords :
Josephson effect; aluminium compounds; critical current density (superconductivity); integrated circuit technology; niobium; superconducting junction devices; type II superconductors; 40 mV; Al deposition; Ar sputtering pressure; Josephson circuit applications; Nb deposition rate; Nb-AlOx-Nb trilayer process; critical current density; junction quality; low stress; multilayer AlOx barrier; superconducting circuits; thermal oxidation; Aluminum; Circuits; Critical current; Critical current density; Josephson junctions; Niobium; Nonhomogeneous media; Oxidation; Pressure control; Stress;
Journal_Title :
Magnetics, IEEE Transactions on