• DocumentCode
    1494254
  • Title

    A finite-element-boundary integral formulation for scattering by three-dimensional cavity-backed apertures

  • Author

    Jin, Jian-Ming ; Volakis, John L.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
  • Volume
    39
  • Issue
    1
  • fYear
    1991
  • fDate
    1/1/1991 12:00:00 AM
  • Firstpage
    97
  • Lastpage
    104
  • Abstract
    A novel numerical technique is proposed for the electromagnetic characterization of the scattering by a three-dimensional cavity-backed aperture in an infinite ground plane. The technique combines the finite element and boundary integral methods to formulate a system of equations for the solution of the aperture fields and those inside the cavity. Specifically, the finite element method is used to formulate the fields in the cavity region, and the boundary integral approach is used in conjunction with the equivalence principle to represent the fields above the ground plane. Unlike traditional approaches, the proposed technique does not require a knowledge of the cavity´s Green´s function and is, therefore, applicable to arbitrary shape depressions and material fillings. Furthermore, the proposed formulation leads to a system having a partly full and partly sparse as well as symmetric and banded matrix which can be solved efficiently using special algorithms
  • Keywords
    boundary-value problems; electromagnetic wave scattering; finite element analysis; EM wave scattering; arbitrary shape depressions; boundary integral approach; equivalence principle; finite element method; finite-element-boundary integral formulation; infinite ground plane; material fillings; symmetric banded matrix; three-dimensional cavity-backed apertures; Admittance; Apertures; Electromagnetic scattering; Filling; Finite difference methods; Finite element methods; Integral equations; Moment methods; Shape; Sparse matrices;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/8.64442
  • Filename
    64442