• DocumentCode
    1494658
  • Title

    Design and Performance of a DNW CMOS Active Pixel Sensor for the ILC Vertex Detector

  • Author

    Traversi, Gianluca ; Bulgheroni, Antonio ; Caccia, Massimo ; Jastrzab, Marcin ; Manghisoni, Massimo ; Pozzati, Enrico ; Ratti, Lodovico ; Re, Valerio

  • Author_Institution
    Dipt. di Ing. Ind., Univ. di Bergamo, Dalmine, Italy
  • Volume
    56
  • Issue
    5
  • fYear
    2009
  • Firstpage
    3002
  • Lastpage
    3009
  • Abstract
    The SDR0 (Sparsified Digital Readout) prototype is a proof-of-principle design which is aimed at studying the feasibility of pixel level sparsified digital readout in CMOS MAPS matching the requirements for the Vertex Detector at the International Linear Collider. The deep n-well (DNW) available in deep sub-micron CMOS processes is used to collect the charge released in the substrate, and signal processing is performed by a classical optimum amplifying stage for capacitive detectors. The chip has been designed in a 130 nm triple-well CMOS process and fabricated by STMicroelectronics. This first prototype includes a 16 times 16 DNW-MAPS matrix with sparsified readout architecture, an 8 times 8 matrix with digital output and selectable access to the analog output in each cell, and a 3 × 3 matrix with all the analog outputs available at the same time. The analog front-end has been characterized and the digital readout circuits have been successfully tested at frequencies up to 50 MHz. The circuit design and the performance of SDR0 are discussed in this paper.
  • Keywords
    CMOS image sensors; digital readout; digital-analogue conversion; monolithic integrated circuits; nuclear electronics; position sensitive particle detectors; signal processing; DAC; DNW; DNW CMOS active pixel sensor; ILC vertex detector; International Linear Collider; MAPS; Monolithic Active Pixel Sensors; STMicroelectronics; Sparsified Digital Readout prototype; analog front-end circuits; capacitive detectors; deep n-well design; digital readout circuits; readout architecture; signal processing; CMOS process; CMOS technology; Circuit synthesis; Circuit testing; Frequency; Prototypes; Radiation detectors; Signal processing; Silicon radiation detectors; Substrates; CMOS; silicon radiation detectors;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2009.2025885
  • Filename
    5280520