• DocumentCode
    1494717
  • Title

    Radiation Sensor Compatible With Standard CMOS Technology

  • Author

    Moreno, E. Garcia ; Picos, R. ; Isern, E. ; Roca, M. ; Bota, S. ; Suenaga, K.

  • Author_Institution
    Univ. of Balearic Islands, Palma, Spain
  • Volume
    56
  • Issue
    5
  • fYear
    2009
  • Firstpage
    2910
  • Lastpage
    2915
  • Abstract
    This paper presents a gamma radiation dosimeter built in a standard 0.35 mum CMOS technology. The dosimeter, which occupies 300 times 150 mum times mum of silicon area, gives a digital output signal of frequency proportional to the total dose. Experimental results up to 1.5 Mrads are presented. Measured low dose radiation responsivity is 84.7 Hz/Krad and sensitivity to temperature and supply voltage are 1.43 kHz/degC and 20.9 kHz/V, respectively.
  • Keywords
    CMOS integrated circuits; MOSFET; dosimeters; elemental semiconductors; gamma-ray effects; silicon; MOSFET sensors; Si; digital output signal; gamma radiation dosimeter; low dose radiation; radiation sensor; silicon; standard CMOS technology; CMOS technology; Charge carrier processes; Electron traps; Integrated circuit technology; MOSFET circuits; Nuclear electronics; Paper technology; Radiation effects; Silicon; Voltage; Gamma dosimeter; MOSFET sensors; radiation effects;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2008.2011804
  • Filename
    5280530